Reflectometry – ND Wireless Institute
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M. J. Filmer, T. A. Zirkle, J. Chisum, A. O Orlov, G. L. Snider, "Using single-electron box arrays for voltage sensing applications" Applied Physics Letters, May. 2020 May. 2020 B. Villis, A. Orlov, X. Jehl, G. Snider, P. Fay, and M. Sanquer, "Defect detection in nano-scale transistors based on radio-frequency reflectometry" Appl. Physics Lett., vol. 99, p. 152-106, pp. 1-3, Oct. 2011 Oct. 2011 B. Villis, A. Orlov, S. Barraud, M. Vinet, M. Sanquer, P. Fay, G. Snider, and X. Jehl, "Direct detection of a transport-blocking trap in a nanoscaled silicon single-electron transistor by radio-frequency reflectometry" Applied Physics Letters, vol. 104, no. 23, p. 1-4, Jun. 2014 Jun. 2014