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W. Chen, J. Yuan, A. Holmes, and P. Fay, "Evaluation of Deep Levels in In0.53Ga0.47As and GaAs0.5Sb0.5 Using Low-Frequency Noise and RTS Noise Characterization" Phys. Stat. Solidi C, vol. 9, pp. 251-254, Dec. 2011 Dec. 2011