Secondary ion mass spectroscopy – ND Wireless Institute
Skip to content
T. Ciarkowski, N. Allen, E. Carlson, R. McCarthy, C. Youtsey, J. Wang, P. Fay, J. Xie, and L. Guido, "Connection Between Carbon Incorporation and Growth Rate for GaN Epitaxial Layers Prepared by OMVPE" Materials, vol. 12, no. 15, pp. 2455-1 -7, Aug. 2019 Aug. 2019