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B. Villis, A. Orlov, X. Jehl, G. Snider,
P. Fay
, and M. Sanquer,
"
Defect detection in nano-scale transistors based on radio-frequency reflectometry
"
Appl. Physics Lett., vol. 99, p. 152-106, pp. 1-3, Oct. 2011
Coulomb blockade
Electrodes
Reflectometry
Single-electron transistors
Transistors
Oct. 2011