Fay and Named 2016 IEEE Fellow

Patrick Fay and Xiaobo Sharon Hu, faculty in the College of Engineering at the University of Notre Dame, have been named fellows of the Institute of Electrical and Electronics Engineers (IEEE). The grade of Fellow is the highest grade of membership conferred by the IEEE Board of Directors upon an individual member. It is bestowed in recognition of outstanding accomplishments in fields related to the IEEE. Fewer than 0.1 percent of voting members are selected annually for this honor.

A graduate of the University, Fay returned to Notre Dame in 1997 after receiving his doctorate, also in electrical engineering, from the University of Illinois at Urbana-Champaign. He currently serves as a professor of electrical engineering, director of the Notre Dame Nanofabrication Facility, a faculty fellow with the Center for Sustainable Energy at Notre Dame, and a member of the University’s Wireless Institute.

Recognized by the IEEE “for contributions to compound semiconductor tunneling and high-speed device technologies,” Fay’s interests include the design, fabrication, and characterization of microwave and millimeter-wave electronic devices and circuits, as well as high-speed optoelectronic devices and optoelectronic integrated circuits for fiber optic telecommunications. His research also includes the development and use of micromachining techniques for the fabrication of microwave components and packaging.

Fay, who currently holds seven patents with several more pending, is a member of Eta Kappa Nu, as well as a member of the IEEE’s Electron Device and Lasers and Electro-optics societies, and the Microwave Theory and Techniques Society. He has contributed nine book chapters, more than 125 refereed papers, and over 125 conference papers, and serves as an IEEE Electron Devices Society Distinguished Lecturer.