B. Villis, A. Orlov, S. Barraud, M. Vinet, M. Sanquer, P. Fay, G. Snider, and X. Jehl,
"Direct detection of a transport-blocking trap in a nanoscaled silicon single-electron transistor by radio-frequency reflectometry"
Applied Physics Letters, vol. 104, no. 23, p. 1-4,
Jun. 2014 | |
Jun. 2014 |