Semiconductor device modeling – ND Wireless Institute
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H. Lu, W. Li, Y. Lu, P. Fay, T. Ytterdal, and A. Seabaugh, "Universal charge-conserving TFET SPICE model incorporating gate current and noise" IEEE J. Explor. Solid-State Comput. Devices Circuit, pp. 1-1, Nov. 2016 Nov. 2016