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"Defect detection in nano-scale transistors based on radio-frequency reflectometry"
Appl. Physics Lett., vol. 99, p. 152-106, pp. 1-3,
Oct. 2011 | |
Oct. 2011 |
B. Villis, A. Orlov, S. Barraud, M. Vinet, M. Sanquer, P. Fay, G. Snider, and X. Jehl,
"Direct detection of a transport-blocking trap in a nanoscaled silicon single-electron transistor by radio-frequency reflectometry"
Applied Physics Letters, vol. 104, no. 23, p. 1-4,
Jun. 2014 | |
Jun. 2014 |