Single-electron transistors – ND Wireless Institute
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B. Villis, A. Orlov, X. Jehl, G. Snider, P. Fay, and M. Sanquer, "Defect detection in nano-scale transistors based on radio-frequency reflectometry" Appl. Physics Lett., vol. 99, p. 152-106, pp. 1-3, Oct. 2011 Oct. 2011 B. Villis, A. Orlov, S. Barraud, M. Vinet, M. Sanquer, P. Fay, G. Snider, and X. Jehl, "Direct detection of a transport-blocking trap in a nanoscaled silicon single-electron transistor by radio-frequency reflectometry" Applied Physics Letters, vol. 104, no. 23, p. 1-4, Jun. 2014 Jun. 2014