Professor and Chair, Department of Computer Science and Engineering, Duda Family Professor of Engineering, and Concurrent Professor of Electrical Engineering
Patrick J. Flynn has held faculty positions at Notre Dame (1990-1991, 2001-present), Washington State University (1991-1998), and Ohio State University (1998-2001). His research interests include computer vision, biometrics, and image processing. Dr. Flynn also conducts research in mobile and embedded computing and systems, with a special interest in mobile, cloud-connected sensors with applications in chemical testing, concussion detection, and biometrics.
Dr. Flynn is an IEEE Fellow, an IAPR Fellow, and a past Associate Editor of IEEE Trans. on Information Forensics and Security, IEEE Trans. on Image Processing, IEEE Trans. on Pattern Analysis and Machine Intelligence, Pattern Recognition and Pattern Recognition Letters. He is also a past Associate Editor-in-Chief of IEEE Trans. on Pattern Analysis and Machine Intelligence. He is currently the Editor-in-Chief of the IEEE Biometrics Compendium, IEEE’s first virtual journal. He has received outstanding teaching awards from Washington State University and the University of Notre Dame.