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W. Chen, J. Yuan, A. Holmes, and
P. Fay
,
"
Evaluation of Deep Levels in In0.53Ga0.47As and GaAs0.5Sb0.5 Using Low-Frequency Noise and RTS Noise Characterization
"
Phys. Stat. Solidi C, vol. 9, pp. 251-254, Dec. 2011
deep levels
Generation-recombination noise
Low-frequency noise
RTS
Dec. 2011