Temperature measurement – ND Wireless Institute
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G. Zhou, Y. Lu, R. Li, Q. Zhang, W.S. Hwang, Q. Liu, T. Vasen, C. Chen, H. Zhu, H.; J.-M. Kuo, S. Koswatta, T. Kosel, M. Wistey, P. Fay, A. Seabaugh, H. G. Xing, "Vertical InGaAs/InP tunnel FETs with tunneling normal to the gate" IEEE Electron Device Letters, vol. 32, no. 11, pp. 1516-1518, Nov. 2011 Nov. 2011