Transistors – ND Wireless Institute
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B. Villis, A. Orlov, X. Jehl, G. Snider, P. Fay, and M. Sanquer, "Defect detection in nano-scale transistors based on radio-frequency reflectometry" Appl. Physics Lett., vol. 99, p. 152-106, pp. 1-3, Oct. 2011 Oct. 2011 R. Li, Y. Lu, G. Zhou, Q. Liu, S. D. Chae, T. Vasen, W. S. Hwang, Q. Zhang, P. Fay, T. Kosel, M. Wistey, H. G. Xing, and A. Seabaugh, "AlGaSb/InAs tunnel field-effect transistor with on-current of 78 μA/μm at 0.5 V" IEEE Electron Device Lett., vol. 33, pp. 363-365, Mar. 2012 Mar. 2012