T. A. Zirkle, M. J. Filmer, J. Chisum, A. O Orlov, E. Dupont-Ferrier, J. Rivard, M. Huebner, M. Sanquer, X. Jehl, G. L. Snider,
"Radio Frequency Reflectometry of Single-Electron Box Arrays for Nanoscale Voltage Sensing Applications"
Applied Sciences,
Jan. 2020 |
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Jan. 2020 |